Nondestructive evaluation of semiconductor materials and devicesby J. N. Zemel
نویسندگان
چکیده
منابع مشابه
Millimeter Wave Doppler Sensor for Nondestructive Evaluation of Materials
INTRODUCTION Resonance modes are intrinsic characteristics of objects when excited at those frequencies. Probing the resonance signatures can reveal useful information about material composition, geometry, presence of defects, and other characteristics of the object under test. Vibration spectra can be measured remotely with high degree of sensitivity using a millimeter wave (mmW) Doppler senso...
متن کاملmorphology, geochemistry, mineralogy, and micromorphology of soils of hormozgan province in relation to parent materials
ویژگی های زمین شیمیایی، کانی شناسی، و میکرومورفولوژیکی خاک ها و سنگ مادر مربوطه در منطقه بین بخش های جنوبی زاگرس و خلیج فارس تا دریای عمان(استان هرمزگان، ایران) مورد بررسی قرار گرفت. هدف های این مطالعه شناسایی تغییرات در خصوصیات فیزیکی، شیمیایی، و ترکیب کانی شناسی خاک، مطالعه میکرومورفولوژی و تکامل خاک، و بررسی توزیع عنصر خاک بر اساس هوازدگی، پروسه های خاک و زمین شناسی جهت توصیف اثرات مواد مادر...
15 صفحه اولSemiconductor Materials :-
The label semiconductor itself provides a hint as to its characteristics. The prefix semis normally applied to a range of levels midway between two limits. The term conductor is applied to any material that will support a generous flow of charge when a voltage source of limited magnitude is applied across its terminals. An insulator is a material that offers a very low level of conductivity und...
متن کاملNondestructive Evaluation of Coatings
Bulk and Rayleigh (or surface wave) velocities of ultrasonic waves in chromium coatings on steel were measured and an experimental correlation was found between the surface velocity and the hardness. Since qualitative coating evaluation is commonly made using hardnesses as a guideline, the possibility is herewith presented of using the so und velocities of surface ultrasonic waves for this purp...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 1980
ISSN: 0021-8898
DOI: 10.1107/s0021889880012253